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Fiber Optic Test Kit
FTK-130
The SYOPTEK FTK series Single Mode/Multimode Fiber Optic Test Kit is the perfect all-in-one fiber optic test equipment kit. The FTK kit provides a wide selection of fiber optic testing, cleaning, and inspection equipment to enable technicians to install, troubleshoot and maintain fiber optic networks. It is really a cost-effective and easy-to-use solution for testing single mode and multimode fiber optic networks, troubleshooting of fiber networks.
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Test Case Generator
Hexawise
Use Hexawise to design better tests. Maximize test coverage with the minimum number of test cases. Find twice as many errors per tester hour. Manually-designed software test plans often omit combinations of functions and configurations that need to be tested. Hexawise leaves no gaps and ensures all important combinations get tested.
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Vacuum Discharge Test Equipment
DAC-VD-1
DAC-VD-1 can locate defective points such as scars or pinholes on stator coils and wires easily.By applying voltage in a vacuum chamber, the electric arcing from a defective part can be discoveredvisually in a short time. DAC-VD-1 can be used widely in variety of applications from product developments to outgoing inspections.
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Flying Probe PCB Test and Repair System
GRS500
Designed to help troubleshoot complex boards when fixture based tools are not a viable solution, the GRS500 is designed to help you compare the characteristics of good and faulty PCBs, using nodal impedance test, and a "Videosection" technique which presents you with high resolution images of a good board for use in live video comparison with the board under test,
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Liquid Dielectric Test Cell
LT-4123
The LT-4123 Liquid Dielectric Test Cell is designed for testing the quality of materials such as the insulating oils used in transformers and the resins used in the manufacture of thermosets. With the LT-4123 Liquid Dielectric Test Cell, users can measure the AC loss characteristics and permittivity of liquids. The data gleaned from these measurements are used to set quality benchmarks for fluids during testing and manufacturing.
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TRMS System Multimeter for Use in Medical and Hygienic Sensible Ranges
SECULIFE HIT MD
TRMS multimeter that has been designed especially for all hygienically sensitive areas. 23 multimeter functions. Voltage measurement.Auto-ranging current measurement from 100A (resolution: 10nA) to 10A (16A). Capacitance and resistance measurement, diode and continuity testing. Measuring categories: 600V CAT III and 300V CAT IV. Hygiene certificate from University of Marburg
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Test Software
Yelo Test Environment V5.0
The Yelo Test Environment (YTE) is an automated test environment developed by Yelo. Test sequences can be developed for multiple products and are tailored to customer needs and specifications. Flexibility in testing is a key benefit of the YTE and is provided to the user by allowing management of test sequence order. There is also the ability for the user to change the test limits or parameters for more or less stringent testing depending on requirements.
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EMI Test System
EMI-9KA
EMI-9KA is an automatic EMI receiver. It is a main test system for EMI (Electro Magnetic Interference) testing. The EMI-9KA is produced by the full closure structure and strong electro-conductibility material, which has high shielding effect. Due to the new technology for the EMI Test System, it solved the instrument self-EMI problem. The test results are according to the international format test report. The EMI Test System EMI-9KA fully meets CISPRl6-1, GB17743, FCC, EN55015 and EN55022.
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IEC60335 Nail Test Probe
CX-Z12
Shenzhen Chuangxin Instruments Co., Ltd.
The Finger Nail Probe is indicated to test IEC 60335 and UL requirements. Used to check the security of parts that snap together. The spring gauge assembled in the handle can be calibrated to the necessary force for using the instrument. This probe is made of stainless steel with appropriated hardened tip and a handle in insulating material. Handle has a special adaptor M5 for use with 50N force gauges.
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Xenon Test Chambers
Weice Testing Instrument Co.,Ltd.
Weice Xenon Test Chambers (Xenon Arc Test Chambers) are used to induce property changes associated with the effects of sunlight, moisture, and heat. The property changes include cracking, color fading and yellowing could be simulated just in few days and weeks.
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Test Handlers
Boston Semi Equipment test handlers are designed for optimum production performance on your test floor.
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MCB Thermal + Magnetic Characteristic Test Bench
The test system is a special version of the thermal + Magnetic test test system. The single power source able to deliver either thermal or magnetic test parameters set on the PC by the user.
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SSD Test Dystems
MPT3000HES / MPT3000HES2
Compact, highly efficient SSD test solution allows customers to accelerate time to qualification for their new designs and time to market for their latest storage products.
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MODBUS RTU Test Software
MODBUS RTU Communication Test Program that helps users troubleshoot MODBUS RTU Communications. The software supports function codes, #3, #6 and #10(hex)
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PCI Express 4 M.2 Receiver Test Automation
N5991PM4A
The N5991PM4A is the receiver test automation software for bit error ratio testers, allowing you to test, debug and characterize PCI Express M.2 devices and hosts at 8 GT/s.
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Probe Needles for Wafer Sort and Test Applications
Advanced Probing Systems, Inc.
APS is the global leader in the manufacture of probe needles used in cantilevered probe cards. All probe needles used in wafer sort are manufactured according to customer specifications using stringent in-process quality assurance procedures.
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Automated Inline In-Circuit Test Solutions
Automated versions of Teradyne’s TestStation systems are designed for short takt time automated lines. The TestStation Automated Inline Handler, coupled with a TestStation Test Insert forms a combined integrated solution for any mix, any volume PCBA manufacturing.
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Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196D
The 16196D surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results – reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement – now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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In-Circuit Test System
TestStation LX
TestStation LX is a cost-effective in-circuit test solution providing high-volume electronics manufacturers with reliable, high-quality test for the latest printed circuit board assembly technologies.
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Test Set
TS® 19
The Fluke Networks TS19 Test Set combines all the essential test set features at an affordable price. This test set was specifically designed for in-house telecom technicians. Its high impedance monitor prevents accidental disruption of service from clipping onto a data line while in monitor mode, thus ensuring the integrity of critical data lines.
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Impact Test Apparatus
SCR Elektroniks make Impact Test Apparatus is used to test the Electrical Accessories / appliances for their mechanical strength.
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Optics Test Equipment + Flatness, Bow, Warp, Curvature, Glass Thickness
Wedge Angle Scanner For Car Windshields
Optik Elektronik Gerätetechnik GmbH
Scanning of complete car windshields for measurement of wedge angle and thickness distribution, in particular in the HUD area.
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Test Equipment
Shenzhen Star Instrument Co., Ltd.
Star Instrument Test Equipment - reference meters, test analyzers, power supplies, and more.
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In-Line RF Test Platform
AR925
This functional and RF test platform combines outstanding productivity with substantial equipment savings. The Faraday chamber of the fixture comes with an interchangeable cassette to minimize the testing cost of each new product
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DC Automated Accelerated Reliability Test Station (AARTS)
DC-HTOL
The DC Automated Accelerated Reliability Test Station (AARTS) systems are designed to maximize channel density. The first systems developed by Accel-RF (ARF) were intended for RF and DC stimulus to the Device Under Test (DUT). However, there are some applications in which RF stimulus is not required.
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Test & Control Suite
TestMaster
TestMaster is a reliable tool for test systems, test beds, or production facilities in industrial enviroments and a flexible tool in the hands of the engineer, scientist, or plant operator. Like an advanced operating system, its individual modules provide straightforward solutions to diverse measuring and testing tasks. test management, test verification, sequence control, hardware abstraction, process data management proceess data distribution and visualization.
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Test Contactor
cDragon
cDragon™ Test Contactor pin’s thermal design supports fast temperature control response and stabilization for repeatable at temperature testing of devices in a handler environment.The homogenous MEMS elastomer-free multi-beam pin delivers long life and high wear resistance. By design the cDragon’s pin decouples insertion motion from the test-interface-board side of the pin. This eliminates test-interface-board pad wear.
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Boundary-Scan Test Coverage Analysis Tool
ScanExpress DFT Analyzer
Test coverage statistics provide engineers and managers valuable information to make critical decisions in product development and manufacturing.ScanExpress DFT Analyzer is an automatic test coverage analysis tool for printed circuit boards and systems that include a mix of boundary-scan and non-boundary-scan devices. The tool assists design and test engineers to increase fault coverage and reduce boundary-scan test procedure development times. Using ScanExpress DFT Analyzer results in better informed test decisions.
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Environmental Test Chambers
Infinity Machine International Inc.
Environmental Test Chambers by Infinity Machine International Inc. - for applications such as hydrostatic test chamber for soles, thermal shock chambers, temperature and humidity test chambers, rainproof testers, UV light testing, and more.
